Keywords Density
| Keyword | Use Count(times) | Use Rate(%) |
|---|---|---|
| gallium | 22 times | 9.65 % |
| gaas | 22 times | 9.65 % |
| semi-conducting | 10 times | 4.39 % |
| arsenide | 8 times | 3.51 % |
| semi-insulating | 5 times | 2.19 % |
| n–type | 5 times | 2.19 % |
| p–type | 5 times | 2.19 % |
| company | 4 times | 1.75 % |
| mehtod | 4 times | 1.75 % |
| limits | 4 times | 1.75 % |
| detection | 4 times | 1.75 % |
| analysis | 4 times | 1.75 % |
| home | 3 times | 1.32 % |
| polycrystalline | 3 times | 1.32 % |
| recapturing | 3 times | 1.32 % |
| analytical | 3 times | 1.32 % |
| service | 3 times | 1.32 % |
| wafers | 3 times | 1.32 % |
| production | 3 times | 1.32 % |
| with | 3 times | 1.32 % |
| products | 2 times | 0.88 % |
| monocrystalline | 2 times | 0.88 % |
| boron | 2 times | 0.88 % |
| oxide | 2 times | 0.88 % |
| services | 2 times | 0.88 % |
| refining | 2 times | 0.88 % |
| documents | 2 times | 0.88 % |
| certification | 2 times | 0.88 % |
| diboron | 2 times | 0.88 % |
| trioxide | 2 times | 0.88 % |
| project | 2 times | 0.88 % |
| supported | 2 times | 0.88 % |
| pzph | 2 times | 0.88 % |
| contact | 2 times | 0.88 % |
| organizational | 2 times | 0.88 % |
| structure | 2 times | 0.88 % |
| purity | 2 times | 0.88 % |
| materials | 2 times | 0.88 % |
| recapture | 1 times | 0.44 % |
| protect | 1 times | 0.44 % |